Example of IEEE Transactions on Reliability format
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Example of IEEE Transactions on Reliability format Example of IEEE Transactions on Reliability format Example of IEEE Transactions on Reliability format Example of IEEE Transactions on Reliability format Example of IEEE Transactions on Reliability format Example of IEEE Transactions on Reliability format Example of IEEE Transactions on Reliability format
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Example of IEEE Transactions on Reliability format Example of IEEE Transactions on Reliability format Example of IEEE Transactions on Reliability format Example of IEEE Transactions on Reliability format Example of IEEE Transactions on Reliability format Example of IEEE Transactions on Reliability format Example of IEEE Transactions on Reliability format
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IEEE Transactions on Reliability — Template for authors

Publisher: IEEE
Categories Rank Trend in last 3 yrs
Safety, Risk, Reliability and Quality #11 of 165 down down by 2 ranks
Electrical and Electronic Engineering #87 of 693 up up by 6 ranks
journal-quality-icon Journal quality:
High
calendar-icon Last 4 years overview: 371 Published Papers | 2871 Citations
indexed-in-icon Indexed in: Scopus
last-updated-icon Last updated: 12/07/2020
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Related Journals

open access Open Access
recommended Recommended

Springer

Quality:  
High
CiteRatio: 16.1
SJR: 2.831
SNIP: 5.451
open access Open Access

IEEE

Quality:  
Good
CiteRatio: 3.5
SJR: 0.384
SNIP: 1.134
open access Open Access

IEEE

Quality:  
High
CiteRatio: 6.4
SJR: 0.786
SNIP: 2.027

Journal Performance & Insights

Impact Factor

CiteRatio

Determines the importance of a journal by taking a measure of frequency with which the average article in a journal has been cited in a particular year.

A measure of average citations received per peer-reviewed paper published in the journal.

3.177

10% from 2018

Impact factor for IEEE Transactions on Reliability from 2016 - 2019
Year Value
2019 3.177
2018 2.888
2017 2.729
2016 2.79
graph view Graph view
table view Table view

7.7

7% from 2019

CiteRatio for IEEE Transactions on Reliability from 2016 - 2020
Year Value
2020 7.7
2019 7.2
2018 5.9
2017 5.3
2016 4.7
graph view Graph view
table view Table view

insights Insights

  • Impact factor of this journal has increased by 10% in last year.
  • This journal’s impact factor is in the top 10 percentile category.

insights Insights

  • CiteRatio of this journal has increased by 7% in last years.
  • This journal’s CiteRatio is in the top 10 percentile category.

SCImago Journal Rank (SJR)

Source Normalized Impact per Paper (SNIP)

Measures weighted citations received by the journal. Citation weighting depends on the categories and prestige of the citing journal.

Measures actual citations received relative to citations expected for the journal's category.

1.032

6% from 2019

SJR for IEEE Transactions on Reliability from 2016 - 2020
Year Value
2020 1.032
2019 1.099
2018 1.54
2017 1.444
2016 1.379
graph view Graph view
table view Table view

2.122

15% from 2019

SNIP for IEEE Transactions on Reliability from 2016 - 2020
Year Value
2020 2.122
2019 1.838
2018 1.941
2017 2.109
2016 2.135
graph view Graph view
table view Table view

insights Insights

  • SJR of this journal has decreased by 6% in last years.
  • This journal’s SJR is in the top 10 percentile category.

insights Insights

  • SNIP of this journal has increased by 15% in last years.
  • This journal’s SNIP is in the top 10 percentile category.

IEEE Transactions on Reliability

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IEEE

IEEE Transactions on Reliability

IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network ...... Read More

Engineering

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Last updated on
11 Jul 2020
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ISSN
0018-9529
i
Impact Factor
High - 2.317
i
Open Access
No
i
Sherpa RoMEO Archiving Policy
Green faq
i
Plagiarism Check
Available via Turnitin
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Endnote Style
Download Available
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Bibliography Name
IEEEtran
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Citation Type
Numbered
[25]
i
Bibliography Example
C. W. J. Beenakker, “Specular andreev reflection in graphene,” Phys. Rev. Lett., vol. 97, no. 6, p.

Top papers written in this journal

Journal Article DOI: 10.1109/TR.1979.5220566
Time-Dependent Error-Detection Rate Model for Software Reliability and Other Performance Measures
Amrit L. Goel1, K. Okumoto1

Abstract:

This paper presents a stochastic model for the software failure phenomenon based on a nonhomogeneous Poisson process (NHPP). The failure process is analyzed to develop a suitable meanvalue function for the NHPP; expressions are given for several performance measures. Actual software failure data are analyzed and compared with... This paper presents a stochastic model for the software failure phenomenon based on a nonhomogeneous Poisson process (NHPP). The failure process is analyzed to develop a suitable meanvalue function for the NHPP; expressions are given for several performance measures. Actual software failure data are analyzed and compared with a previous analysis. read more read less

Topics:

Software measurement (56%)56% related to the paper, Software quality (54%)54% related to the paper, Software system (52%)52% related to the paper, Software performance testing (51%)51% related to the paper, Software release life cycle (51%)51% related to the paper
1,704 Citations
Journal Article DOI: 10.1109/24.229504
Exponentiated Weibull family for analyzing bathtub failure-rate data
G.S. Mudholkar1, D.K. Srivastava1

Abstract:

A simple generalization of the Weibull distribution is presented. The distribution is well suited for modeling bathtub failure rate lifetime data and for testing goodness-of-fit of the Weibull and negative exponential models as subhypotheses. > A simple generalization of the Weibull distribution is presented. The distribution is well suited for modeling bathtub failure rate lifetime data and for testing goodness-of-fit of the Weibull and negative exponential models as subhypotheses. > read more read less

Topics:

Exponentiated Weibull distribution (79%)79% related to the paper, Bathtub curve (67%)67% related to the paper, Weibull fading (65%)65% related to the paper, Weibull modulus (63%)63% related to the paper, Weibull distribution (62%)62% related to the paper
1,028 Citations
Journal Article DOI: 10.1109/TR.1983.5221735
S-Shaped Reliability Growth Modeling for Software Error Detection
Shigeru Yamada1, Mitsuru Ohba2, Shunji Osaki3

Abstract:

This paper investigates a stochastic model for a software error detection process in which the growth curve of the number of detected software errors for the observed data is S-shaped. The software error detection model is a nonhomogeneous Poisson process where the mean-value function has an S-shaped growth curve. The model i... This paper investigates a stochastic model for a software error detection process in which the growth curve of the number of detected software errors for the observed data is S-shaped. The software error detection model is a nonhomogeneous Poisson process where the mean-value function has an S-shaped growth curve. The model is applied to actual software error data. Statistical inference on the unknown parameters is discussed. The model fits the observed data better than other models. read more read less

Topics:

Curve fitting (61%)61% related to the paper, Software quality (59%)59% related to the paper, Putnam model (59%)59% related to the paper, Software system (58%)58% related to the paper, Software (57%)57% related to the paper
780 Citations
Journal Article DOI: 10.1109/24.510811
Reliability optimization of series-parallel systems using a genetic algorithm
David W. Coit1, Alice E. Smith2

Abstract:

A problem-specific genetic algorithm (GA) is developed and demonstrated to analyze series-parallel systems and to determine the optimal design configuration when there are multiple component choices available for each of several k-out-of-n:G subsystems. The problem is to select components and redundancy-levels to optimize som... A problem-specific genetic algorithm (GA) is developed and demonstrated to analyze series-parallel systems and to determine the optimal design configuration when there are multiple component choices available for each of several k-out-of-n:G subsystems. The problem is to select components and redundancy-levels to optimize some objective function, given system-level constraints on reliability, cost, and/or weight. Previous formulations of the problem have implicit restrictions concerning the type of redundancy allowed, the number of available component choices, and whether mixing of components is allowed. GA is a robust evolutionary optimization search technique with very few restrictions concerning the type or size of the design problem. The solution approach was to solve the dual of a nonlinear optimization problem by using a dynamic penalty function. GA performs very well on two types of problems: (1) redundancy allocation originally proposed by Fyffe, Hines, Lee, and (2) randomly generated problem with more complex k-out-of-n:G configurations. read more read less

Topics:

Constrained optimization (57%)57% related to the paper, Nonlinear programming (57%)57% related to the paper, Combinatorial optimization (57%)57% related to the paper, Redundancy (engineering) (57%)57% related to the paper, Genetic algorithm (56%)56% related to the paper
777 Citations
Journal Article DOI: 10.1109/24.159800
Dynamic fault-tree models for fault-tolerant computer systems
Joanne Bechta Dugan1, Salvatore J. Bavuso2, Mark A. Boyd3

Abstract:

Reliability analysis of fault-tolerant computer systems for critical applications is complicated by several factors. Systems designed to achieve high levels of reliability frequently employ high levels of redundancy, dynamic redundancy management, and complex fault and error recovery techniques. This paper describes dynamic f... Reliability analysis of fault-tolerant computer systems for critical applications is complicated by several factors. Systems designed to achieve high levels of reliability frequently employ high levels of redundancy, dynamic redundancy management, and complex fault and error recovery techniques. This paper describes dynamic fault-tree modeling techniques for handling these difficulties. Three advanced fault-tolerant computer systems are described: a fault-tolerant parallel processor, a mission avionics system, and a fault-tolerant hypercube. Fault-tree models for their analysis are presented. HARP (Hybrid Automated Reliability Predictor) is a software package developed at Duke University and NASA Langley Research Center that can solve those fault-tree models. > read more read less

Topics:

Redundancy (engineering) (60%)60% related to the paper, Fault tolerance (57%)57% related to the paper, Fault tree analysis (56%)56% related to the paper, Reliability theory (55%)55% related to the paper, Avionics (52%)52% related to the paper
730 Citations
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IEEE Transactions on Reliability format uses IEEEtran citation style.

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Frequently asked questions

1. Can I write IEEE Transactions on Reliability in LaTeX?

Absolutely not! Our tool has been designed to help you focus on writing. You can write your entire paper as per the IEEE Transactions on Reliability guidelines and auto format it.

2. Do you follow the IEEE Transactions on Reliability guidelines?

Yes, the template is compliant with the IEEE Transactions on Reliability guidelines. Our experts at SciSpace ensure that. If there are any changes to the journal's guidelines, we'll change our algorithm accordingly.

3. Can I cite my article in multiple styles in IEEE Transactions on Reliability?

Of course! We support all the top citation styles, such as APA style, MLA style, Vancouver style, Harvard style, and Chicago style. For example, when you write your paper and hit autoformat, our system will automatically update your article as per the IEEE Transactions on Reliability citation style.

4. Can I use the IEEE Transactions on Reliability templates for free?

Sign up for our free trial, and you'll be able to use all our features for seven days. You'll see how helpful they are and how inexpensive they are compared to other options, Especially for IEEE Transactions on Reliability.

5. Can I use a manuscript in IEEE Transactions on Reliability that I have written in MS Word?

Yes. You can choose the right template, copy-paste the contents from the word document, and click on auto-format. Once you're done, you'll have a publish-ready paper IEEE Transactions on Reliability that you can download at the end.

6. How long does it usually take you to format my papers in IEEE Transactions on Reliability?

It only takes a matter of seconds to edit your manuscript. Besides that, our intuitive editor saves you from writing and formatting it in IEEE Transactions on Reliability.

7. Where can I find the template for the IEEE Transactions on Reliability?

It is possible to find the Word template for any journal on Google. However, why use a template when you can write your entire manuscript on SciSpace , auto format it as per IEEE Transactions on Reliability's guidelines and download the same in Word, PDF and LaTeX formats? Give us a try!.

8. Can I reformat my paper to fit the IEEE Transactions on Reliability's guidelines?

Of course! You can do this using our intuitive editor. It's very easy. If you need help, our support team is always ready to assist you.

9. IEEE Transactions on Reliability an online tool or is there a desktop version?

SciSpace's IEEE Transactions on Reliability is currently available as an online tool. We're developing a desktop version, too. You can request (or upvote) any features that you think would be helpful for you and other researchers in the "feature request" section of your account once you've signed up with us.

10. I cannot find my template in your gallery. Can you create it for me like IEEE Transactions on Reliability?

Sure. You can request any template and we'll have it setup within a few days. You can find the request box in Journal Gallery on the right side bar under the heading, "Couldn't find the format you were looking for like IEEE Transactions on Reliability?”

11. What is the output that I would get after using IEEE Transactions on Reliability?

After writing your paper autoformatting in IEEE Transactions on Reliability, you can download it in multiple formats, viz., PDF, Docx, and LaTeX.

12. Is IEEE Transactions on Reliability's impact factor high enough that I should try publishing my article there?

To be honest, the answer is no. The impact factor is one of the many elements that determine the quality of a journal. Few of these factors include review board, rejection rates, frequency of inclusion in indexes, and Eigenfactor. You need to assess all these factors before you make your final call.

13. What is Sherpa RoMEO Archiving Policy for IEEE Transactions on Reliability?

SHERPA/RoMEO Database

We extracted this data from Sherpa Romeo to help researchers understand the access level of this journal in accordance with the Sherpa Romeo Archiving Policy for IEEE Transactions on Reliability. The table below indicates the level of access a journal has as per Sherpa Romeo's archiving policy.

RoMEO Colour Archiving policy
Green Can archive pre-print and post-print or publisher's version/PDF
Blue Can archive post-print (ie final draft post-refereeing) or publisher's version/PDF
Yellow Can archive pre-print (ie pre-refereeing)
White Archiving not formally supported
FYI:
  1. Pre-prints as being the version of the paper before peer review and
  2. Post-prints as being the version of the paper after peer-review, with revisions having been made.

14. What are the most common citation types In IEEE Transactions on Reliability?

The 5 most common citation types in order of usage for IEEE Transactions on Reliability are:.

S. No. Citation Style Type
1. Author Year
2. Numbered
3. Numbered (Superscripted)
4. Author Year (Cited Pages)
5. Footnote

15. How do I submit my article to the IEEE Transactions on Reliability?

It is possible to find the Word template for any journal on Google. However, why use a template when you can write your entire manuscript on SciSpace , auto format it as per IEEE Transactions on Reliability's guidelines and download the same in Word, PDF and LaTeX formats? Give us a try!.

16. Can I download IEEE Transactions on Reliability in Endnote format?

Yes, SciSpace provides this functionality. After signing up, you would need to import your existing references from Word or Bib file to SciSpace. Then SciSpace would allow you to download your references in IEEE Transactions on Reliability Endnote style according to Elsevier guidelines.

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I spent hours with MS word for reformatting. It was frustrating - plain and simple. With SciSpace, I can draft my manuscripts and once it is finished I can just submit. In case, I have to submit to another journal it is really just a button click instead of an afternoon of reformatting.

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