抗原变异可使得多种致病微生物易于逃避宿主免疫应答。表达在感染红细胞表面的恶性疟原虫红细胞表面蛋白1（PfPMP1）与感染红细胞、内皮细胞、树突状细胞以及胎盘的单个或多个受体作用，在黏附及免疫逃避中起关键的作用。每个单倍体基因组var基因家族编码约60种成员，通过启动转录不同的var基因变异体为抗原变异提供了分子基础。

疟原虫var基因转换速率变化导致抗原变异[英]／Paul H, Robert P, Christodoulou Z, et al//Proc Natl Acad Sci U S A

/pdf/self-assembled-monolayers-of-thiolates-on-metals-as-a-form-1neb0hj3k4.pdf

Self-assembled monolayers of thiolates on metals as a form of nanotechnology.

Chemical sensors based on individual single-walled carbon nanotubes (SWNTs) are demonstrated. Upon exposure to gaseous molecules such as NO 2 or NH 3 , the electrical resistance of a semiconducting SWNT is found to dramatically increase or decrease. This serves as the basis for nanotube molecular sensors. The nanotube sensors exhibit a fast response and a substantially higher sensitivity than that of existing solid-state sensors at room temperature. Sensor reversibility is achieved by slow recovery under ambient conditions or by heating to high temperatures. The interactions between molecular species and SWNTs and the mechanisms of molecular sensing with nanotube molecular wires are investigated.

https://science.sciencemag.org/content/sci/287/5453/622.full.pdf

Nanotube molecular wires as chemical sensors

In this work we present a low cost and scalable technique, via ambient pressure chemical vapor deposition (CVD) on polycrystalline Ni films, to fabricate large area (∼cm2) films of single- to few-layer graphene and to transfer the films to nonspecific substrates. These films consist of regions of 1 to ∼12 graphene layers. Single- or bilayer regions can be up to 20 μm in lateral size. The films are continuous over the entire area and can be patterned lithographically or by prepatterning the underlying Ni film. The transparency, conductivity, and ambipolar transfer characteristics of the films suggest their potential as another materials candidate for electronics and opto-electronic applications.

/pdf/large-area-few-layer-graphene-films-on-arbitrary-substrates-6jt6fxed99.pdf

Large Area, Few-Layer Graphene Films on Arbitrary Substrates by Chemical Vapor Deposition

Images and force measurements taken by an atomic‐force microscope (AFM) depend greatly on the properties of the spring and tip used to probe the sample’s surface. In this article, we describe a simple, nondestructive procedure for measuring the force constant, resonant frequency, and quality factor of an AFM cantilever spring and the effective radius of curvature of an AFM tip. Our procedure uses the AFM itself and does not require additional equipment.

Calibration of atomic‐force microscope tips

The scanning tunneling microscope is proposed as a method to measure forces as small as 10-18 N. As one application for this concept, we introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale. The atomic force microscope is a combination of the principles of the scanning tunneling microscope and the stylus profilometer. It incorporates a probe that does not damage the surface. Our preliminary results in air demonstrate a lateral resolution of 30 A and a vertical resolution less than 1 A.

https://link.aps.org/pdf/10.1103/PhysRevLett.56.930

Atomic force microscope

Recent progress1,2,3 in the synthesis of high-quality single-walled carbon nanotubes4 (SWNTs) has enabled the measurement of their physical and materials properties5,6,7,8. The idea that nanotubes might be integrated with conventional microstructures to obtain new types of nanoscale devices, however, requires an ability to synthesize, isolate, manipulate and connect individual nanotubes. Here we describe a strategy for making high-quality individual SWNTs on silicon wafers patterned with micrometre-scale islands of catalytic material. We synthesize SWNTs by chemical vapour deposition of methane on the patterned substrates. Many of the synthesized nanotubes are perfect, individual SWNTs with diameters of 1–3 nm and lengths of up to tens of micrometres. The nanotubes are rooted in the islands, and are easily located, characterized and manipulated with the scanning electron microscope and atomic force microscope. Some of the SWNTs bridge two metallic islands, offering the prospect of using this approach to develop ultrafine electrical interconnects and other devices.

Synthesis of individual single-walled carbon nanotubes on patterned silicon wafers

The atomic force microscope (AFM) can be used to image the surface of both conductors and nonconductors even if they are covered with water or aqueous solutions. An AFM was used that combines microfabricated cantilevers with a previously described optical lever system to monitor deflection. Images of mica demonstrate that atomic resolution is possible on rigid materials, thus opening the possibility of atomic-scale corrosion experiments on nonconductors. Images of polyalanine, an amino acid polymer, show the potential of the AFM for revealing the structure of molecules important in biology and medicine. Finally, a series of ten images of the polymerization of fibrin, the basic component of blood clots, illustrate the potential of the AFM for revealing subtle details of biological processes as they occur in real time.

https://science.sciencemag.org/content/sci/243/4898/1586.full.pdf

Imaging crystals, polymers, and processes in water with the atomic force microscope.

Atomic force microscopy (AFM) is a newly developed high resolution microscopy technique which is capable of mapping forces near surfaces or, by means of these forces, the topography of the surface itself. In one mode of operation, AFM can resolve individual atoms on both conducting and insulating surfaces. A crucial component for the AFM is a flexible force‐sensing cantilever stylus, whose properties should include, among other things: a sharp tip, a low force constant, and a high mechanical resonance frequency. These requirements can be met by reducing the size of the cantilever stylus through microfabrication techniques and employing novel methods to construct a sharp tip. Presented here are a number of microfabrication processes for constructing cantilever styli with properties ideal for the AFM. These fabrication processes include (1) a method for producing thin film SiO2 or Si3N4 cantilevers without tips, (2) a method for producing Si3N4 cantilevers with integrated pyramidal tips formed by using an e...

Microfabrication of cantilever styli for the atomic force microscope

A new detection scheme for atomic force microscopy (AFM) is shown to yield atomic resolution images of conducting and nonconducting layered materials. This detection scheme uses a piezoresistive strain sensor embedded in the AFM cantilever. The cantilever is batch fabricated using standard silicon micromachining techniques. The deflection of the cantilever is measured directly from the resistance of the piezoresistive strain sensor without the need for external deflection sensing elements. Using this cantilever we achieved 0.1 Arms vertical resolution in a 10 Hz–1 kHz bandwidth.

Calvin F. Quate

Papers

Atomic force microscope

Synthesis of individual single-walled carbon nanotubes on patterned silicon wafers

Imaging crystals, polymers, and processes in water with the atomic force microscope.

Microfabrication of cantilever styli for the atomic force microscope

Atomic resolution with an atomic force microscope using piezoresistive detection