E
Elliott Cooper-Balis
Researcher at University of Maryland, College Park
Publications - 7
Citations - 1272
Elliott Cooper-Balis is an academic researcher from University of Maryland, College Park. The author has contributed to research in topics: Memory architecture & Thermocouple. The author has an hindex of 6, co-authored 7 publications receiving 1179 citations.
Papers
More filters
Journal ArticleDOI
DRAMSim2: A Cycle Accurate Memory System Simulator
TL;DR: The process of validating DRAMSim2 timing against manufacturer Verilog models in an effort to prove the accuracy of simulation results is described.
Journal ArticleDOI
The structural simulation toolkit
Arun Rodrigues,Karl Scott Hemmert,Brian W. Barrett,C. Kersey,Ron A. Oldfield,M. Weston,R. Risen,Jeanine Cook,Paul Rosenfeld,Elliott Cooper-Balis,Bruce Jacob +10 more
TL;DR: The Structural Simulation Toolkit (SST) as discussed by the authors is an open, modular, parallel, multi-criteria, multiscale simulation framework for HPC systems that includes a number of processor, memory, and network models.
Journal ArticleDOI
Fine-Grained Activation for Power Reduction in DRAM
Elliott Cooper-Balis,Bruce Jacob +1 more
TL;DR: This DRAM architecture optimization, which appears transparent to the memory controller, significantly reduces power consumption and enables a finer-grained selection when activating a portion of the DRAM array.
Journal ArticleDOI
Buffer-on-board memory systems
TL;DR: A hardware-verified simulation suite is developed and full system simulations are performed to better understand how this memory system interacts with an operating system executing an application with the goal of uncovering behaviors not present in simple limit case simulations.
Journal ArticleDOI
Microhotplate Temperature Sensor Calibration and BIST.
Muhammad Y. Afridi,Christopher B. Montgomery,Elliott Cooper-Balis,Stephen Semancik,Kenneth G. Kreider,Jon Geist +5 more
TL;DR: It is shown that aluminum- and polysilicon-based temperature sensors, which are not stable enough for measuring high microhotplate temperatures without impractically frequent recalibration, can be used to measure the silicon substrate temperature if never exposed to temperatures above about 220 °C.