This survey provides an overview of higher-order tensor decompositions, their applications, and available software. A tensor is a multidimensional or $N$-way array. Decompositions of higher-order tensors (i.e., $N$-way arrays with $N \geq 3$) have applications in psycho-metrics, chemometrics, signal processing, numerical linear algebra, computer vision, numerical analysis, data mining, neuroscience, graph analysis, and elsewhere. Two particular tensor decompositions can be considered to be higher-order extensions of the matrix singular value decomposition: CANDECOMP/PARAFAC (CP) decomposes a tensor as a sum of rank-one tensors, and the Tucker decomposition is a higher-order form of principal component analysis. There are many other tensor decompositions, including INDSCAL, PARAFAC2, CANDELINC, DEDICOM, and PARATUCK2 as well as nonnegative variants of all of the above. The N-way Toolbox, Tensor Toolbox, and Multilinear Engine are examples of software packages for working with tensors.

/pdf/tensor-decompositions-and-applications-46vl2ih5gn.pdf

Tensor Decompositions and Applications

There is an increasing demand for dynamic systems to become safer and more reliable This requirement extends beyond the normally accepted safety-critical systems such as nuclear reactors and aircraft, where safety is of paramount importance, to systems such as autonomous vehicles and process control systems where the system availability is vital It is clear that fault diagnosis is becoming an important subject in modern control theory and practice Robust Model-Based Fault Diagnosis for Dynamic Systems presents the subject of model-based fault diagnosis in a unified framework It contains many important topics and methods; however, total coverage and completeness is not the primary concern The book focuses on fundamental issues such as basic definitions, residual generation methods and the importance of robustness in model-based fault diagnosis approaches In this book, fault diagnosis concepts and methods are illustrated by either simple academic examples or practical applications The first two chapters are of tutorial value and provide a starting point for newcomers to this field The rest of the book presents the state of the art in model-based fault diagnosis by discussing many important robust approaches and their applications This will certainly appeal to experts in this field Robust Model-Based Fault Diagnosis for Dynamic Systems targets both newcomers who want to get into this subject, and experts who are concerned with fundamental issues and are also looking for inspiration for future research The book is useful for both researchers in academia and professional engineers in industry because both theory and applications are discussed Although this is a research monograph, it will be an important text for postgraduate research students world-wide The largest market, however, will be academics, libraries and practicing engineers and scientists throughout the world

Robust Model-Based Fault Diagnosis for Dynamic Systems

Matrix Differential Calculus with Applications in Statistics and Econometrics

This paper provides an overview and analysis of statistical process monitoring methods for fault detection, identification and reconstruction. Several fault detection indices in the literature are analyzed and unified. Fault reconstruction for both sensor and process faults is presented which extends the traditional missing value replacement method. Fault diagnosis methods that have appeared recently are reviewed. The reconstruction-based approach and the contribution-based approach are analyzed and compared with simulation and industrial examples. The complementary nature of the reconstruction- and contribution-based approaches is highlighted. An industrial example of polyester film process monitoring is given to demonstrate the power of the contribution- and reconstruction-based approaches in a hierarchical monitoring framework. Finally we demonstrate that the reconstruction-based framework provides a convenient way for fault analysis, including fault detectability, reconstructability and identifiability conditions, resolving many theoretical issues in process monitoring. Additional topics are summarized at the end of the paper for future investigation. Copyright © 2003 John Wiley & Sons, Ltd.

Statistical process monitoring: basics and beyond

The N-way Toolbox for MATLAB

The process chemometrics approach to process monitoring and fault detection

Multivariate statistical process control (MSPC) tools have been developed for monitoring a Lam 9600 TCP metal etcher at Texas Instruments. These tools are used to determine if the etch process is operating normally or if a system fault has occurred. Application of these methods is complicated because the etch process data exhibit a large amount of normal systematic variation. Variations due to faults of process concern can be relatively minor in comparison. The Lam 9600 used in this study is equipped with several sensor systems including engineering variables (e.g. pressure, gas flow rates and power), spatially resolved optical emission spectroscopy (OES) of the plasma and a radio-frequency monitoring (RFM) system to monitor the power and phase relationships of the plasma generator. A variety of analysis methods and data preprocessing techniques have been tested for their sensitivity to specific system faults. These methods have been applied to data from each of the sensor systems separately and in combination. The performance of the methods on a set of benchmark fault detection problems is presented and the strengths and weaknesses of the methods are discussed, along with the relative advantages of each of the sensor systems. Copyright © 1999 John Wiley & Sons, Ltd.

A comparison of principal component analysis, multiway principal component analysis, trilinear decomposition and parallel factor analysis for fault detection in a semiconductor etch process

http://www.eigenvector.com/Docs/robustness.pdf

Development and Benchmarking of Multivariate Statistical Process Control Tools for a Semiconductor Etch Process: Improving Robustness through Model Updating

Neal B. Gallagher

Papers

The process chemometrics approach to process monitoring and fault detection

A comparison of principal component analysis, multiway principal component analysis, trilinear decomposition and parallel factor analysis for fault detection in a semiconductor etch process

Development and Benchmarking of Multivariate Statistical Process Control Tools for a Semiconductor Etch Process: Improving Robustness through Model Updating

Curve resolution for multivariate images with applications to TOF-SIMS and Raman

A new approach for interactive self-modeling mixture analysis