N
Nikolaos Vourdas
Researcher at American Hotel & Lodging Educational Institute
Publications - 46
Citations - 1653
Nikolaos Vourdas is an academic researcher from American Hotel & Lodging Educational Institute. The author has contributed to research in topics: Plasma etching & Thin film. The author has an hindex of 19, co-authored 45 publications receiving 1428 citations.
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Mechanisms of oxygen plasma nanotexturing of organic polymer surfaces: from stable super hydrophilic to super hydrophobic surfaces.
Katerina Tsougeni,Nikolaos Vourdas,Angeliki Tserepi,Evangelos Gogolides,Christophe Cardinaud +4 more
TL;DR: It is proved that control of plasma nanotexture can be achieved by carefully choosing the reactor wall material and X-ray photoelectron spectroscopy is used to study the surface chemical modification in the plasma.
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Nanotextured super-hydrophobic transparent poly(methyl methacrylate) surfaces using high-density plasma processing
TL;DR: In this paper, an environmentally friendly, rapid, no-rinse and mass-production amenable plasma process for the fabrication of super-hydrophobic poly(methyl methacrylate) (PMMA) surfaces using only a one load/unload step in a low-pressure, high-density plasma reactor was presented.
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Optical and structural properties of copper oxide thin films grown by oxidation of metal layers
TL;DR: In this paper, the Tauc-Lorentz (TL) model was used to simulate the dispersion of the complex refractive index of disordered films, and the gap of the Cu2O films was free of localized states.
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All-plastic, low-power, disposable, continuous-flow PCR chip with integrated microheaters for rapid DNA amplification
Despina Moschou,Nikolaos Vourdas,George Kokkoris,George Papadakis,John Parthenios,Stavros Chatzandroulis,Angeliki Tserepi +6 more
TL;DR: In this article, a low-cost and low-power, continuous-flow microfluidic device for DNA amplification by polymerase chain reaction (PCR) with integrated heating elements, on a commercially available thin polymeric substrate (Pyralux® Polyimide), is presented.
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Deposition and characterization of copper oxide thin films
TL;DR: In this paper, thin films of copper oxide that were deposited by oxidation of copper thin films on silicon substrates in temperatures varying from 150 °C up to 450 °C were estimated from the evaporated mass.