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R. Ryan Vallance

Researcher at George Washington University

Publications -  90
Citations -  1125

R. Ryan Vallance is an academic researcher from George Washington University. The author has contributed to research in topics: Optical fiber & Ferrule. The author has an hindex of 20, co-authored 87 publications receiving 1081 citations. Previous affiliations of R. Ryan Vallance include Teradyne.

Papers
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Micro machining glass with polycrystalline diamond tools shaped by micro electro discharge machining

TL;DR: In this paper, the feasibility of micro machining glass materials with polycrystalline diamond (PCD) micro tools that are prepared in a variety of shapes using noncontact micro electro discharge machining is demonstrated.
Patent

Split via surface mount connector and related techniques

TL;DR: An interconnection circuit is a plated through hole having a plurality of electrically isolated segments with at least one of the plurality of isolated segments coupled to a signal path as discussed by the authors.
Journal ArticleDOI

A unified geometric model for designing elastic pivots

TL;DR: In this article, a more general geometric model suited to representing the entire family of conic section shapes using quadratic rational Bezier curves is presented, and the utility of this formulation is demonstrated by optimizing an elastic pivot to meet compliance and stress requirements.
Journal ArticleDOI

Micro-machining and micro-grinding with tools fabricated by micro electro-discharge machining

TL;DR: In this paper, the authors provide an overview of several approaches to micro-machining by mechanical and electro-discharge means of material removal, and trade-offs such as tool wear, material removal rate (MRR), and machining time are discussed.
Journal ArticleDOI

Correcting capacitive displacement measurements in metrology applications with cylindrical artifacts

TL;DR: In this article, the authors quantifies and experimentally verifies these errors for a commonly used sensor, and a simulation of a nanometer-level measurement of out-of-roundness and spindle error motion demonstrates that measurement accuracy is improved with corrected sensitivities.