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Robert Baumann

Researcher at German Aerospace Center

Publications -  87
Citations -  6223

Robert Baumann is an academic researcher from German Aerospace Center. The author has contributed to research in topics: Soft error & Plume. The author has an hindex of 33, co-authored 86 publications receiving 5747 citations. Previous affiliations of Robert Baumann include Texas Instruments.

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Radiation-induced soft errors in advanced semiconductor technologies

TL;DR: In this article, the authors review the types of failure modes for soft errors, the three dominant radiation mechanisms responsible for creating soft errors in terrestrial applications, and how these soft errors are generated by the collection of radiation-induced charge.
Journal ArticleDOI

Soft errors in advanced computer systems

TL;DR: This article comprehensively analyzes soft-error sensitivity in modern systems and shows it to be application dependent.
Journal ArticleDOI

Soft errors in advanced semiconductor devices-part I: the three radiation sources

TL;DR: In this paper, the authors summarize the key distinguishing characteristics and sources of the three primary radiation mechanisms responsible for inducing soft errors in semiconductor devices and discuss methods useful for reducing the impact of the effects in final packaged parts.
Proceedings ArticleDOI

The impact of technology scaling on soft error rate performance and limits to the efficacy of error correction

TL;DR: Memory and logic scaling trends are discussed along with a method for determining logic SER, the soft error rate of advanced CMOS devices, which may limit future product reliability.