Journal ArticleDOI
Soft errors in advanced semiconductor devices-part I: the three radiation sources
TLDR
In this paper, the authors summarize the key distinguishing characteristics and sources of the three primary radiation mechanisms responsible for inducing soft errors in semiconductor devices and discuss methods useful for reducing the impact of the effects in final packaged parts.Abstract:
In this review paper, we summarize the key distinguishing characteristics and sources of the three primary radiation mechanisms responsible for inducing soft errors in semiconductor devices and discuss methods useful for reducing the impact of the effects in final packaged parts.read more
Citations
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Journal ArticleDOI
Sequential Element Design With Built-In Soft Error Resilience
Ming Zhang,Subhasish Mitra,Tak M. Mak,N. Seifert,N.J. Wang,Quan Shi,Kee Sup Kim,Naresh R. Shanbhag,Sanjay J. Patel +8 more
TL;DR: The presented error-correcting latch and flip-flop designs are power efficient, introduce minimal speed penalty, and employ reuse of on-chip scan design- for-testability and design-for-debug resources to minimize area overheads.
Journal ArticleDOI
Cache and memory error detection, correction, and reduction techniques for terrestrial servers and workstations
TL;DR: In most system applications, a combination of several techniques is required to meet the necessary reliability and data-integrity targets, and the tradeoffs of these techniques in terms of area, power, and performance penalties versus increased reliability are covered.
BookDOI
Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation
Alfredo Benso,Paolo Prinetto +1 more
TL;DR: In this paper, a comprehensive guide to fault injection techniques used to evaluate the dependability of a digital system is presented, along with a critical analysis of different fault injection tools and techniques.
Proceedings ArticleDOI
Automatic Instruction-Level Software-Only Recovery
TL;DR: Three automatic, instruction-level, software-only recovery techniques representing different trade-offs between reliability and performance are described.
Proceedings ArticleDOI
A soft error rate analysis (SERA) methodology
Ming Zhang,Naresh R. Shanbhag +1 more
TL;DR: Results show that the SER of logic is a much stronger function of timing parameters than the supply voltage, and an "SER peaking" phenomenon in multipliers is observed where the center bits have an SER that is in order of magnitude greater than that of LSBs and MSBs.
References
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Journal ArticleDOI
Alpha-particle-induced soft errors in dynamic memories
T. C. May,M.H. Woods +1 more
TL;DR: In this article, a new physical soft error mechanism in dynamic RAM's and CCD's is proposed, which is caused by the passage of alpha particles through the memory array area.
Journal ArticleDOI
Single event upset at ground level
TL;DR: In this paper, ground level upsets have been observed in computer systems containing large amounts of random access memory (RAM). Atmospheric neutrons are most likely the major cause of the upsets based on measured data using the Weapons Neutron Research (WNR) neutron beam.
Journal ArticleDOI
Terrestrial cosmic rays
TL;DR: The terrestrial flux of nucleons can be attenuated by shielding, making a significant reduction in the electronic system soft-error rate, and estimates of such attenuation are made.
Journal ArticleDOI
Terrestrial cosmic ray intensities
TL;DR: The penetration of cosmic rays through the earth's atmosphere, and the parameters which affect the terrestrial flux are reviewed, showing the final particle flux to vary mainly with the site's geomagnetic coordinates and its altitude.
Journal ArticleDOI
Fragment formation studied with antisymmetrized version of molecular dynamics with two-nucleon collisions.
TL;DR: A new microscopic simulation method of heavy-ion collisions is formulated by incorporating the two-nucleon collision process into the antisymmetrized version of molecular dynamics, which can describe quantum-mechanical features such as shell effects.
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