S
S van Haver
Researcher at Delft University of Technology
Publications - 13
Citations - 326
S van Haver is an academic researcher from Delft University of Technology. The author has contributed to research in topics: Zernike polynomials & Diffraction. The author has an hindex of 9, co-authored 13 publications receiving 307 citations.
Papers
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Journal ArticleDOI
Numerical analysis of a slit-groove diffraction problem
Mondher Besbes,Jean-Paul Hugonin,Philippe Lalanne,S van Haver,O.T.A. Janssen,A.M. Nugrowati,M. Xu,Silvania F. Pereira,H.P. Urbach,H.P. Urbach,A.S. Van de Nes,Peter Bienstman,Gérard Granet,Antoine Moreau,Stefan F. Helfert,Maxim Sukharev,Tamar Seideman,Fadi Issam Baida,Brahim Guizal,D. Van Labeke +19 more
TL;DR: In this paper, a comparison among several fully-vectorial methods applied to a basic scattering problem governed by the physics of the electromagnetic interaction between subwavelength apertures in a metal film is presented.
Book ChapterDOI
Assessment of optical systems by means of point-spread functions
TL;DR: In this paper, the authors presented the computation of the point-spread function of optical imaging systems and the characterization of these systems by means of the measured three-dimensional structure of the PFF, which is a nonlinear function of the basic electromagnetic field components in the focal region.
Journal ArticleDOI
Advanced analytic treatment and efficient computation of the diffraction integrals in the extended Nijboer-Zernike theory
S van Haver,Ajem Guido Janssen +1 more
TL;DR: In this paper, a review of the computational methods for the diffraction integrals that occur in the Extended Nijboer-Zernike (ENZ-) approach to circular, aberrated, defocused optical systems are reviewed and updated.
Journal ArticleDOI
Zernike representation and Strehl ratio of optical systems with variable numerical aperture
TL;DR: In this article, the Zernike coefficients of the pupil function were used for the forward calculation of point spread functions and aberration retrieval within the Extended Nijboer-Zernike (ENZ) formalism for optical systems with reduced numerical aperture.
Journal ArticleDOI
High-NA aberration retrieval with the Extended Nijboer-Zernike vector diffraction theory
TL;DR: In this paper, the authors presented the first results of such a reconstruction operation for optical systems with a high numerical aperture using a point source in the object plane, using the extended Nijboer-Zernike diffraction analysis that has been modified to incorporate vector diffraction effects.