scispace - formally typeset
A

A. K. Geim

Researcher at University of Manchester

Publications -  64
Citations -  76887

A. K. Geim is an academic researcher from University of Manchester. The author has contributed to research in topics: Graphene & Bilayer graphene. The author has an hindex of 33, co-authored 64 publications receiving 70432 citations.

Papers
More filters
Journal ArticleDOI

Two-dimensional gas of massless Dirac fermions in graphene

TL;DR: This study reports an experimental study of a condensed-matter system (graphene, a single atomic layer of carbon) in which electron transport is essentially governed by Dirac's (relativistic) equation and reveals a variety of unusual phenomena that are characteristic of two-dimensional Dirac fermions.
Journal ArticleDOI

Raman spectrum of graphene and graphene layers.

TL;DR: This work shows that graphene's electronic structure is captured in its Raman spectrum that clearly evolves with the number of layers, and allows unambiguous, high-throughput, nondestructive identification of graphene layers, which is critically lacking in this emerging research area.
Journal ArticleDOI

Fine Structure Constant Defines Visual Transparency of Graphene

TL;DR: It is shown that the opacity of suspended graphene is defined solely by the fine structure constant, a = e2/hc � 1/137 (where c is the speed of light), the parameter that describes coupling between light and relativistic electrons and that is traditionally associated with quantum electrodynamics rather than materials science.
Journal ArticleDOI

Detection of individual gas molecules adsorbed on graphene

TL;DR: In this paper, it was shown that micrometre-size sensors made from graphene are capable of detecting individual events when a gas molecule attaches to or detaches from graphene's surface.
Journal ArticleDOI

The structure of suspended graphene sheets

TL;DR: These studies by transmission electron microscopy reveal that individual graphene sheets freely suspended on a microfabricated scaffold in vacuum or air are not perfectly flat: they exhibit intrinsic microscopic roughening such that the surface normal varies by several degrees and out-of-plane deformations reach 1 nm.