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G

G. Pautasso

Researcher at Max Planck Society

Publications -  18
Citations -  1606

G. Pautasso is an academic researcher from Max Planck Society. The author has contributed to research in topics: ASDEX Upgrade & Plasma. The author has an hindex of 13, co-authored 18 publications receiving 1427 citations.

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Chapter 3: MHD stability, operational limits and disruptions

TL;DR: A review of recent advances in the area of MHD stability and disruptions, since the publication of the 1999 ITER Physics Basis document (1999 Nucl. Fusion 39 2137-2664), is reviewed in this paper.
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Disruption studies in ASDEX Upgrade in view of ITER

TL;DR: In this article, an effective electron density equal to 24% of the critical density has been reached after injection of 3.3?bar?l of neon, but the resultant large plasma density is very poloidally and toroidally asymmetric; this implies that several valves distributed around the plasma periphery become necessary at this level of massive gas injection to ensure a homogeneous density distribution.

Plasma shut-down with fast impurity puff on ASDEX Upgrade

TL;DR: In this article, a massive injection of impurity gas into a plasma has been proved to reduce forces and localized thermal loads caused by disruptions in tokamaks, and this mitigation system is routinely used on ASDEX Upgrade to shut down plasmas with a locked mode.
Journal ArticleDOI

Plasma shut-down with fast impurity puff on ASDEX Upgrade

TL;DR: In this paper, a massive injection of impurity gas into a plasma has been proved to reduce forces and localized thermal loads caused by disruptions in tokamaks, and this mitigation system is routinely used on ASDEX Upgrade to shut down plasmas with a locked mode.
Journal ArticleDOI

Use of Impurity Pellets to Control Energy Dissipation During Disruption

TL;DR: Injection of impurity pellets has been shown to be a successful method of reducing thermal and mechanical loads during disruptions in ASDEX upgrade as discussed by the authors, and the requirements of such a method for mitigating disruptions in future devices are discussed.