J
J. Mitard
Publications - 1
Citations - 499
J. Mitard is an academic researcher. The author has contributed to research in topics: High-κ dielectric & Reliability (semiconductor). The author has an hindex of 1, co-authored 1 publications receiving 474 citations.
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Review on high-k dielectrics reliability issues
G. Ribes,J. Mitard,M. Denais,Sylvie Bruyere,Frederic Monsieur,Chittoor Parthasarathy,Emmanuel Vincent,Gerard Ghibaudo +7 more
TL;DR: In this article, the authors review the status of reliability studies of high-k gate dielectrics and try to illustrate it with experimental results, showing that the reliability of Hf-based materials is influenced both by the interfacial layer as well as the high k layer.