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Jeremy L. Schroeder

Researcher at Purdue University

Publications -  10
Citations -  676

Jeremy L. Schroeder is an academic researcher from Purdue University. The author has contributed to research in topics: Metamaterial & Surface roughness. The author has an hindex of 6, co-authored 9 publications receiving 597 citations. Previous affiliations of Jeremy L. Schroeder include University of California, Berkeley.

Papers
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Journal ArticleDOI

Titanium nitride as a plasmonic material for visible and near-infrared wavelengths

TL;DR: In this article, the excitation of surface-plasmon-polaritons on titanium nitride thin films was demonstrated and the performance of various plasmonic and metamaterial structures with the material as the plammonic component was discussed.
Patent

Metallized silicon substrate for indium gallium nitride light-emitting diode

TL;DR: In this article, a light emitting diode having a metallized silicon substrate including a silicon base, a buffer layer disposed on the silicon base and an oxidation prevention layer on the metal layer is presented.
Patent

Laminated thin film metal-semiconductor multilayers for thermoelectrics

TL;DR: In this paper, a thermoelectric segment and a method for fabricating is presented, which includes forming structures by depositing thin-film metal-semiconductor multilayers on substrates and depositing metal layers on the multilayer, joining metal bonding layers to form dual structures with combined bonding layers; and removing at least one of the substrates.
Journal ArticleDOI

Self-supporting nanowire arrays templated in sacrificial branched porous anodic alumina for thermoelectric devices

TL;DR: In this paper, an approach for creating a branched PAA template is described, where the template is selectively etched after electrodeposition of desired materials, yielding self-supporting nanowire arrays with thickness up to about 300μm, thereby eliminating the thermal shunt through the template.
Journal ArticleDOI

Pulsed Laser Annealing of Silicon-Germanium Films

TL;DR: In this paper, the authors investigated the possibility of using pulsed laser annealing to locally tailor the physical properties of Si1-xGex (18% < × < 90%) prepared by low pressure chemical vapor deposition (LPCVD) at 400°C.