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Fifty Years of Moore's Law
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Moore's Law as mentioned in this paper provides a history of Moore's Law through its many changes and reinterpretations, containing possibly a few new ones as well, as well as possibly a new one as well.Abstract:
The 1959 invention of the planar silicon transistor led to the development of the integrated circuit (IC) and the growth trend in IC complexity known as Moore's Law While Moore's observation came in 1965, his original trend line showing a doubling of components per chip each year began with one component in 1959 Thus, we have now experienced 50 years of Moore's Law This paper provides a history of Moore's Law through its many changes and reinterpretations, containing possibly a few new ones as wellread more
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Lithium and lithium ion batteries for applications in microelectronic devices: A review
TL;DR: In this article, chemistry and electrochemistry in different microbatteries along with their cell designs to meet the goals of their various applications are reviewed and the state-of-the-art knowledge and recent progress of micro-atteries for emerging micro-electronic devices may shed light on the future development of micro batteries towards high energy density and flexible design.
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Good Computational Practice in the Assignment of Absolute Configurations by TDDFT Calculations of ECD Spectra.
Gennaro Pescitelli,Torsten Bruhn +1 more
TL;DR: A discussion on what can be called good computational practice in running TDDFT ECD calculations, highlighting the most crucial points with several examples from the recent literature is presented.
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Carbon nanotube electronics: recent advances
TL;DR: A doping-free approach for carbon nanotubes (CNTs) has emerged from this research as mentioned in this paper, which utilizes the contact control on the properties of field effect transistors (FETs), preserving the perfect lattice of the CNT making it possible for CNT FETs to outperform Si devices.
Journal ArticleDOI
Metrology for the next generation of semiconductor devices
Ndubuisi G. Orji,Mustafa Badaroglu,Bryan M. Barnes,Carlos Beitia,Benjamin Bunday,Umberto Celano,Regis J. Kline,Mark Neisser,Yaw S. Obeng,András E. Vladár +9 more
TL;DR: In this article, the authors review state-of-the-art dimensional metrology methods for integrated circuits, considering the advantages, limitations and potential improvements of the various approaches, and describe how integrated circuit device design and industry requirements will affect lithography options and consequently metrology requirements.
Journal ArticleDOI
Automated Visual Defect Detection for Flat Steel Surface: A Survey
TL;DR: This article attempts to present a comprehensive survey on surface defect detection technologies by reviewing about 120 publications over the last two decades for three typical flat steel products of con-casting slabs and hot- and cold-rolled steel strips.
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Journal ArticleDOI
Cramming More Components Onto Integrated Circuits
TL;DR: Integrated circuits will lead to such wonders as home computers or at least terminals connected to a central computer, automatic controls for automobiles, and personal portable communications equipment as mentioned in this paper. But the biggest potential lies in the production of large systems.
Journal Article
Cramming More Components onto Integrated Circuits
TL;DR: Integrated circuits will lead to such wonders as home computers or at least terminals connected to a central computer, automatic controls for automobiles, and personal portable communications equipment as discussed by the authors. But the biggest potential lies in the production of large systems.
Journal ArticleDOI
Moore's law: past, present and future
TL;DR: Moore's Law has become the central driving force of one of the most dynamic of the world's industries as discussed by the authors, and it is viewed as a reliable method of calculating future trends as well, setting the pace of innovation, and defining the rules and the very nature of competition.
Journal Article
Progress in digital integrated electronics
TL;DR: In this article, the authors examined how long exponent i a l g r o w t h i n c o n t r i b u t i o n s h a v e been i m p o r t a n t i n t e c o m p l e x i e x p e c t e m e r e r i n f i g u r e I n t o d i f e r E I n f ǫ r e c e t e r m e n t and how t h e y m i g
Proceedings Article
Progress in digital integrated electronics
TL;DR: The expected t rends can be recombined to see how long exponent i a l g r o w t h i n c o m p l e x i t y c a n b e e x p e c t e d t o con t inue.