J
Jing Wen
Researcher at Tsinghua University
Publications - 27
Citations - 2116
Jing Wen is an academic researcher from Tsinghua University. The author has contributed to research in topics: Chemistry & Medicine. The author has an hindex of 8, co-authored 12 publications receiving 1809 citations. Previous affiliations of Jing Wen include Harbin Normal University.
Papers
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Journal ArticleDOI
Interface-Induced High-Temperature Superconductivity in Single Unit-Cell FeSe Films on SrTiO3
Qingyan Wang,Qingyan Wang,Zhi Li,Wenhao Zhang,Zuocheng Zhang,Jinsong Zhang,Wei Li,Hao Ding,Yunbo Ou,Peng Deng,Kai Chang,Jing Wen,Can-Li Song,Ke He,Jin-Feng Jia,Shuai-Hua Ji,Yayu Wang,Lili Wang,Xi Chen,Xucun Ma,Qi-Kun Xue +20 more
TL;DR: In this paper, the authors reported high transition temperature superconductivity in one unitcell (UC) thick FeSe films grown on a Se-etched SrTiO3 (001) substrate by molecular beam epitaxy (MBE).
Journal ArticleDOI
Band structure engineering in (Bi 1− x Sb x ) 2 Te 3 ternary topological insulators
Jinsong Zhang,Cui-Zu Chang,Cui-Zu Chang,Zuocheng Zhang,Jing Wen,Xiao Feng,Kang Li,Minhao Liu,Ke He,Lili Wang,Xi Chen,Qi-Kun Xue,Qi-Kun Xue,Xucun Ma,Yayu Wang +14 more
TL;DR: This work demonstrates a new route to achieving intrinsic quantum transport of the topological surface states and designing conceptually new topologically insulating devices based on well-established semiconductor technology.
Journal ArticleDOI
Topological insulator thin films of Bi2Te3 with controlled electronic structure.
Guang Wang,Xie-Gang Zhu,Yi-Yang Sun,Yaoyi Li,Tong Zhang,Jing Wen,Xi Chen,Ke He,Lili Wang,Xucun Ma,Jin-Feng Jia,Shengbai Zhang,Qi-Kun Xue,Qi-Kun Xue +13 more
TL;DR: Topological insulator thin films of Bi2Te3 with controlled electronic structure can be grown by regulating the molecular beam epitaxy growth kinetics without any extrinsic doping, a step toward controlling topological surface states.
Journal ArticleDOI
Atomically smooth ultrathin films of topological insulator Sb2Te3
Guang Wang,Xie-Gang Zhu,Jing Wen,Xi Chen,Ke He,Lili Wang,Xucun Ma,Ying Liu,Ying Liu,Ying Liu,Xi Dai,Zhong Fang,Jin-Feng Jia,Jin-Feng Jia,Qi-Kun Xue,Qi-Kun Xue +15 more
TL;DR: Using in situ scanning tunneling microscopy (STM) and angle-resolved photoemission spectroscopy (ARPES), this article showed that moderately thick Sb2Te3 films grown layer-by-layer by molecular beam epitaxy on Si(111) are atomically smooth, single-crystalline, and intrinsically insulating.
Journal ArticleDOI
In situ Raman spectroscopy of topological insulator Bi 2 Te 3 films with varying thickness
Chun-Xiao Wang,Chun-Xiao Wang,Xie-Gang Zhu,Louis Nilsson,Jing Wen,Guang Wang,Xin-Yan Shan,Qing Zhang,Shulin Zhang,Jin-Feng Jia,Jin-Feng Jia,Qi-Kun Xue +11 more
TL;DR: In this paper, the Raman spectra of topological insulator Bi2Te 3 films prepared by molecular beam epitaxy (MBE) have been measured by an in situ ultrahigh vacuum (UHV)-MBE-Raman spectroscopy system.